The book presents highly technical approaches to the probabilistic physics of failure analysis and applications to accelerated life and degradation testing to reliability prediction and assessment. Beside reviewing a select set of important failure mechanisms, the book covers basic and advanced methods of performing accelerated life test and accelerated degradation tests and analyzing the test data. The book includes a large number of very useful examples to help readers understand complicated methods described. Finally, MATLAB, R and OpenBUGS computer scripts are provided and discussed to support complex computational probabilistic analyses introduced.
Категория: электроника
ISBN: 9781119388685
Правообладатель: John Wiley & Sons Limited
Легальная стоимость: 20541.79 руб.
Ограничение по возрасту: 0+
Комментарии ():