Measurement Technology for Micro-Nanometer Devices

2.85 из 5, отдано 11 голосов

A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices

Категория: электроника

ISBN: 9781118717981

Правообладатель: John Wiley & Sons Limited

Легальная стоимость: 16283.51 руб.

Ограничение по возрасту: 0+

Читать книгу «Measurement Technology for Micro-Nanometer Devices» онлайн:

Комментарии ():