Mechanical Stress on the Nanoscale. Simulation, Material Systems and Characterization Techniques

3.55 из 5, отдано 16 голосов

Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.

Категория: зарубежная образовательная литература

ISBN: 9783527639564

Правообладатель: John Wiley & Sons Limited

Легальная стоимость: 20409.92 руб.

Ограничение по возрасту: 0+

Читать книгу «Mechanical Stress on the Nanoscale. Simulation, Material Systems and Characterization Techniques» онлайн:

Комментарии ():